Entry requirements

Quantum physics. Solid state physics I.

Aims

The aim of this course is to give the students general knowledge about a number of analysis methods,

used today in physics, chemistry and materials science and also in industrial research and development.

The aim is also to give the students practical skill to operate a few instruments. In this way a student will

gain deepened knowledge about these particular methods and their practical applications.

Content

The analysis methods which at present are planned to be treated in the course comprize scanning electron

microscopy (SEM) with energy dispersive X-ray analysis (EDX), optical spectroscopy with a Fourier

Transform Infrared (FTIR) spectrometer, high resolution mass spectroscopy with an ICR (ion cyclotron

resonance) mass spectrometer, depth profile analysis with Rutherford Back Scattering (RBS)

spectrometry, surface analysis with electronspectroscopy (ESCA, XPS, Auger) and with optical

ellipsometry.

The practical work at the instruments is made in groups containing two to four students guided by an experienced scientist.

Instruction

The course consists of lectures and practical supervised analysis work at research instruments.

Assessment

Written examination on the theoretical part at the end of the course. Passed written report of the practical work is also required.