Aims

After completing the course the student should be able to:

- Understand the construction and the theory behind the following materials analysis techniques: scanning electron microscopy, energy dispersive X-ray spectroscopy, transmission electron microscopy, Auger electron spectroscopy, photo electron spectroscopy, glow discharge optical emission spectroscopy, Rutherford backscatter spectroscopy and Raman spectroscopy.

The student should also be able to:

- Run a scanning electron microscope and optimise the instrument for high resolution, long depth of field or energy dispersive X-ray spectroscopy.

- Make a qualitative and quantitative analysis of an unknown sample by using energy dispersive X-ray spectroscopy.

- Run a transmission electron microscope and to image a sample in bright field mode and dark field mode.

- Describe the crystallographic properties of a solid by using electron diffraction.

- Describe and run an atomic force microscope and to know advantages and limitations with the technique.

- Run and understand the advantages and disadvantages with Auger electron spectroscopy and X-ray photon spectroscopy.

- Know the advantages and disadvantages with the following analytical techniques: Rutherford backscattering and Raman spectroscopy.

- Correctly choose a series of analytical technique and analyse an unknown sample with respect to microstructure, composition and crystallography.

Content

X-ray fluorescence spectroscopy, scanning electronmicroscopy, transmmission electro spectroscopy, energy dispersive X-ray spectroscopy

Instruction

Lectures, seminars, experimental work and demonstrations. Training in oral and written reports. The experimental work is compulsory.

Assessment

Written exam at the end of the course. The experimental work and reports are assigned 2 points.