Learning outcomes

On completion of the course the student shall be able to:

• motivate and discuss choice of methods for surface characterization by comparing performance and judging usefulness of different methods for a given problem,
• describe the principles, including the interaction between the probe and sample surface, for surface imaging and measurement using electron, light, interference and scanning probe microscopy, and describe the design of some instruments,
• describe the principles for Scanning Electron Micrsocopy (SEM) and X-ray spectroscopy (EDS) in SEM,
• describe the principles for hardness testing and nanoindentation,
• explain and compare information, quality and performance for different settings, using instruments for surface characterization.

Content

The course introduces modern techniques for imaging, description and measurement of surfaces. Methods included are e.g. Scanning Electron Microscopy (SEM), X-ray spectroscopy in SEM (EDS), Light Optical Microscopy (LOM), interference microscopy (CSI), Scanning Probe Microscopy (AFM etc.), mechanical profilometry, surface statistics, hardness measurements and nanoindentation. The methods are used for both academic and industrial research and development.

Instruction

Lectures, seminars, laboratory work.

Assessment

Written exam (4 credits). Laboratory work, excercises and assignments (1 credit).

If there are special reasons for doing so, an examiner may make an exception from the method of assessment indicated and allow a student to be assessed by another method. An example of special reasons might be a certificate regarding special pedagogical support from the disability coordinator of the university.