Philips MRD

Philips MRD I

A very flexible system with modular components, "prefix" and a semi-circular cradle, as well as x, y and z motors. Systems can be configured for many different types of measurements of thin films but also bulk materials can be analyzed. With this system, you can make almost all types of measurement with low and medium resolution (4-crystal monochromators are missing), several components provide high intensity, which enables fast measurements.

Primary optics, both point and line focus can be used.

Point focus

• Split system
• X-ray lens for high intensity in texture and stress measurement.

Line focus

• Programmable and manual slots
• Ni/C X-ray mirror
• Hybrid monochromator that provides pure CuKα1 radiation

Sekundary optics

• Pixcel 3D area detector
• Parallel Beam Collimator (0.09, 0.18 and 0.27º) with monochromator
• Detector X-ray mirror (Ni/C)
• Two-crystal analyzer

Examples of measurements

• Very fast θ-2θ measurements (Bragg-Brentano)
• Reciprocal space mappning (RSM) for epitaxial films.
• Texture
• Voltage measurement
• Low angle measurements, GIXRD, XRR
  

Philips MRD II

A system with modular components, "prefix" and a semi-circular cradle, as well as x, y and z motor. System is designed for low angle measurements, GIXRD and XRR on thin films. The cradle is used as a motorized sample changer.

Primary line focus

• X-ray mirror
• Automatic beam filter
• Soller

Secondary optics, four different possibilities

1. Programmable slots (for calibration only)
2. Parallel Beam Collimator (0.09º)
3. Parallel Beam Collimator (0.27º)
4. Parallel Beam Collimator (0.27º) with monochromator

Motorized x, y, z, PSI and PHI for sample alignment, sample exchange.