Atomic Force Microscope (AFM/MFM)
The Bruker Dimension Icon™ AFM is a is high resolution and low noise level Scanning Probe Microscope (SPM). Designed to deliver atomic-level resolution, exceptional stability, and ease of use, it enables precise nanoscale surface visualization and property measurement.
- Scan-Asyst mode is ease of use with highest levels of performance
- The highest resolution ever on a large-sample SPM
- The higher scan speed, without loss of image quality, enabling greater throughput for data collection
- Latest version of NanoScope software offers an intuitive workflow and default experiment modes that simplifies advanced SPM processes by using preconfigured settings
- High-resolution camera and X-Y positioning permit faster, more efficient sample navigation
General purpose
Atomic Force Microscopy (AFM)
- Contact Mode
- Tapping Mode
- Fluid Imaging
- Can image atomically thin materials with very high precision
Magnetic Force Microscopy (MFM)
- With in field imaging option up to 1 tesla field.
- Can detect weak magnetic signals with a LM-HR tip
- Providing topographic and magnetic properties data in parallel
Samples type
Thin films, solid materials, fluid samples, 2D materials.
Hourly rates
Academic users
1200 SEK/h (for assisted users)
500 SEK/h (for non-assisted users)
Industrial users
2400 SEK/h (for assisted users)
1000 SEK/h (for non-assisted users)
