Electromagnetic Properties of Dielectric and Magnetic Materials and Electromagnetic Interference Shielding (EMI) measurements

The Keysight N5227A Vector Network Analyzer (VNA) is an instrument that can measure the frequency variation of scattering parameters (S – parameters) of a one port or two-port electromagnetic circuit. For measurements, rectangular waveguides are used. The samples are slotted inside the rectangular sample holder (Fig. 1) and sandwiched in between the two waveguide adapters.

Relative complex permittivity and permeability of samples can be estimated based on different mathematical models via the Keysight N1500A Materials Measurement Suite (run on a computer attached to the VNA). The most commonly used model is the Nicolson Ross Weir model which gives good estimate of the material parameters.

Waveguides available
X-band ( 8.2 – 12.4 GHz), and Ku-band (12.4 – 18 GHz)

Sample requirements
Samples have to be in proper dimensions to be fit inside the sample holders.

X-band: 22.86 mm ´ 10.16 mm; Ku-band: 15.79 mm ´ 7.89 mm. Refer to - Waveguide Sizes | Dimensions & Cutoff Frequency - everything RF

Sample thickness is preferably within 1 – 3 mm. Thicker samples can be measured but this adds uncertainty to the permittivity and permeability estimates. Thickness should not exceed 5 mm as it will go beyond the thickness of the sample holder.

Hourly rates
Academic users
2000 SEK/h (for assisted users)
1625 SEK/h (for non-assisted users)

Industrial users
4000 SEK/h (for assisted users)