Ion-beam based materials analysis

Ion-beam interactions with the sample

When ions interact with solids, many different processes can occur: Ions are scattered, recoiling target atoms can leave the sample, photons and electrons are emitted, and nuclear reactions may occur. The probability of these processes happening depends on the specific ion-target combination and the incident ion energy.

Types of ion beam analysis (IBA) methods

In our group we perform all standard ion beam analysis (IBA) methods in dedicated beamlines and experimental set-ups, such as:

• Conventional Rutherford Backscattering Spectrometry (RBS) for non-destructive depth profiling
• Elastic Recoil Detection Analysis (ERDA) for light-element detection
• Nuclear Reaction Analysis (NRA) for isotope specific concentration profiling
• Particle Induced X-ray Emission (PIXE) for trace-element analysis

These techniques can partially be combined with a microbeam or channelling experiments for analysis of crystalline materials.

Besides standard IBA with MeV ions, we also have the possibility to perform analysis with keV ions. An overview of all available methods can be found here.

Applications of IBA are manifold, and every year we analyse a wide range of different samples. Some recent examples featuring analysis of materials for energy applications and hard coatings are highlighted below.

Selected publications