Ion beam-based materials analysis

Ion beam-based techniques can provide depth-resolved, quantitative and non-destructive composition analysis of materials. At the Tandem Laboratory we offer all standard IBA methods as well as microbeam, channelling and in-situ and in-operando measurements.

When ions interact with solids, many different processes can occur: Ions are scattered, recoiling target atoms can leave the sample, photons and electrons are emitted, and nuclear reactions may occur. The probability of these processes happening depends on the specific ion-target combination and the incident ion energy.

In our group we perform all standard ion beam analysis (IBA) methods in dedicated beamlines and experimental set-ups, such as:

• Conventional Rutherford Backscattering Spectrometry (RBS) for non-destructive depth profiling,
• Elastic Recoil Detection Analysis (ERDA) for light-element detection,
• Nuclear Reaction Analysis (NRA) for isotope specific concentration profiling,
• Particle Induced X-ray Emission (PIXE) for trace-element analysis.

These techniques can be partially combined with a microbeam or channelling experiments for analysis of crystalline materials. We also have experimental set-ups that provide a combination of IBA with capabilities for materials growth and modification allowing for in-situ and in-operando measurements.

Besides standard IBA with MeV ions, we also have the possibility to perform analysis with keV ions. An overview of all available methods can be found here.

Applications of IBA are manifold, and every year we analyse a wide range of different samples. Some recent examples are highlighted below.

Selected publications